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X-ray crystallography is the experimental science of determining the atomic and molecular structure of a crystal, in which the crystalline structure causes a beam of incident X-rays to diffract in specific directions. By measuring the angles and intensities of the X-ray diffraction, a crystallographer can produce a three-dimensional picture of ...
X-ray optics. X-ray optics is the branch of optics that manipulates X-rays instead of visible light. It deals with focusing and other ways of manipulating the X-ray beams for research techniques such as X-ray diffraction, X-ray crystallography, X-ray fluorescence, small-angle X-ray scattering, X-ray microscopy, X-ray phase-contrast imaging, and ...
Miller indices form a notation system in crystallography for lattice planes in crystal (Bravais) lattices . In particular, a family of lattice planes of a given (direct) Bravais lattice is determined by three integers h, k, and ℓ, the Miller indices. They are written ( hkℓ ), and denote the family of (parallel) lattice planes (of the given ...
X-ray fluorescence. XRF scanning of the Rembrandt -painting Syndics of the Drapers' Guild. A handheld XRF analyzer gun. X-ray fluorescence ( XRF) is the emission of characteristic "secondary" (or fluorescent) X-rays from a material that has been excited by being bombarded with high-energy X-rays or gamma rays.
Nanox says the ARC comes in at 70 kg versus 2,000 kg for the average CT scanner, and production costs are around $10,000 compared to $1-3 million for the CT scanner. But in addition to being ...
X-ray. Natural color X-ray photogram of a wine scene. Note the edges of hollow cylinders as compared to the solid candle. William Coolidge explains medical imaging and X-rays. X-rays ( X-radiation) are a form of high-energy electromagnetic radiation.
Here () is the reflectivity, = /, is the X-ray wavelength (typically copper's K-alpha peak at 0.154056 nm), is the density deep within the material and is the angle of incidence. Below the critical angle Q < Q c {\displaystyle Q<Q_{c}} (derived from Snell's law ), 100% of incident radiation is reflected through total external reflection , R ...
Texture can be determined by various methods. Some methods allow a quantitative analysis of the texture, while others are only qualitative. Among the quantitative techniques, the most widely used is X-ray diffraction using texture goniometers, followed by the electron backscatter diffraction (EBSD) method in scanning electron microscopes.